Growth Structures and Method for Forming Laser Diodes on  or Off Cut Gallium and Nitrogen Containing Substrates

ABSTRACT

An optical device having a structured active region configured for one or more selected wavelengths of light emissions and formed on an off-cut m-plane gallium and nitrogen containing substrate.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims priority to U.S. Application Nos. 61/243,502,filed Sep. 17, 2009, and 61/249,568, filed Oct. 7, 2009, each of whichis incorporated by reference in its entirety.

BACKGROUND OF THE INVENTION

This invention is directed to optical devices. In particular, theinvention provides a method of manufacture and a device for emittingelectromagnetic radiation using nonpolar or semipolar gallium containingsubstrates, such as GaN, AlN, InN, InGaN, AlGaN, and AlInGaN, andothers. More particularly, the invention provides a device using agallium and nitrogen containing substrate configured on the {20-21}family of planes or an off-cut of the {20-21} family of planes towardsthe c-plane and/or towards the a-plane. The invention can be applied tooptical devices, lasers, light emitting diodes, solar cells,photoelectrochemical water splitting and hydrogen generation,photodetectors, integrated circuits, and transistors, as well as otherdevices.

In the late 1800's, Thomas Edison invented the light bulb. Theconventional light bulb, commonly called the “Edison bulb,” has beenused for over one hundred years for a variety of applications includinglighting and displays. The conventional light bulb uses a tungstenfilament enclosed in a glass bulb sealed in a base, which is screwedinto a socket. The socket is coupled to a power source. The conventionallight bulb can be found commonly in structures, and is used for indoorand outdoor lighting. Unfortunately, drawbacks exist with theconventional Edison light bulb.

The conventional light bulb dissipates more than 90% of the energysupplied as thermal energy. Reliability is also an issue since the bulbroutinely fails due to thermal expansion and contraction of the filamentelement. In addition, light bulbs emit light over a broad spectrum, muchof which does not result in useful illumination due to the spectralsensitivity of the human eye. Another disadvantage is that light bulbsemit light in all directions. Thus they are not ideal for applicationsrequiring strong directionality or focus, such as projection displays,optical data storage, or specialized directed lighting.

In 1960, the laser was first demonstrated by Theodore H. Maiman atHughes Research Laboratories in Malibu. This laser utilized asolid-state flash lamp-pumped synthetic ruby crystal to produce redlaser light at 694 nm. By 1964, blue and green laser light wasdemonstrated by William Bridges at Hughes Aircraft utilizing an Argonion laser. The Ar-ion laser utilized Argon as the active medium andproduced laser light output in the UV, blue, and green wavelengthsincluding 351 nm, 454.6 nm, 457.9 nm, 465.8 nm, 476.5 nm, 488.0 nm,496.5 nm, 501.7 nm, 514.5 nm, and 528.7 nm. The Ar-ion laser had thebenefit of producing highly directional and focusable light, with anarrow spectral output. The wall plug efficiency, however, was less than1 percent, and the size, weight, and cost of the lasers were undesirableas well.

As laser technology evolved, more efficient lamp pumped solid statelaser designs were developed for the red and infrared wavelengths, butthese technologies remained a challenge for blue and green and bluelasers. As a result, lamp pumped solid state lasers were developed inthe infrared, and the output wavelength was converted to the visibleusing special crystals with nonlinear optical properties. For example, agreen lamp pumped solid state laser had 3 stages: electricity powerslamp, lamp excites gain crystal which lases at 1064 nm, 1064 nmradiation goes into frequency conversion crystal which converts it tovisible 532 nm. The resulting green and blue lasers were sometimescalled “lamp pumped solid state lasers with second harmonic generation.”These lasers had a wall plug efficiency of ˜1%, and were more efficientthan Ar-ion gas lasers. They were, however, still too inefficient,large, expensive, fragile for broad deployment outside of specialtyscientific and medical applications. Additionally, the gain crystal usedin the solid state lasers typically had energy storage properties whichmade the lasers difficult to modulate at high speeds which limited itsbroader deployment.

High power diode (or semiconductor) lasers improve the efficiency ofthese visible lasers. These “diode pumped solid state lasers with SHG”(DPSS with SHG) had 3 stages: electricity powers 808 nm diode laser, 808nm excites gain crystal which lases at 1064 nm, 1064 nm goes intofrequency conversion crystal which converts to visible 532 nm. The DPSSlaser technology extended the life and improved the wall plug efficiencyof the LPSS lasers to 5-10%. Further commercialization followed, notablyinto more high-end specialty industrial, medical, and scientificapplications. The change to diode pumping, however, increased the systemcost and required precise temperature controls, leaving the laser withsubstantial size and power consumption, while not addressing theproperties which made the lasers difficult to modulate at high speeds.

As high power laser diodes evolved and new specialty SHG crystals weredeveloped, it became possible to directly convert the output of theinfrared diode laser to produce blue and green laser light output. These“directly doubled diode lasers” or SHG diode lasers had 2 stages:electricity powers 1064 nm semiconductor laser, 1064 nm goes intofrequency conversion crystal which converts to visible 532 nm greenlight. These lasers designs are meant to improve the efficiency, costand size compared to DPSS-SHG lasers, but the specialty diodes andcrystals required make this challenging today. Additionally, while thediode-SHG lasers can be directly modulated, they suffer from sensitivityto temperature which limits their application. Thus techniques forimproving optical devices are highly desired.

BRIEF SUMMARY OF THE INVENTION

This invention provides a method of manufacture and a device foremitting electromagnetic radiation using nonpolar or semipolar galliumcontaining substrates such as GaN, AlN, InN, InGaN, AlGaN, and AlInGaN,and others. More particularly, the present invention provides a methodand device using a gallium and nitrogen containing {20-21} substrate oroff cut of the {20-21} plane towards the c-plane and/or towards thea-plane according to one or more embodiments, but there can be otherconfigurations. As used herein, the term “off-cut” or mis-cut” may beused interchangeably without departing from the scope of the claimsherein.

In a specific embodiment, the invention provides a laser diode device ona crystal plane oriented between −8 degrees and 8 degrees from {20-21}towards c-plane. The surface orientation of the crystal plane can bemiscut from +/5 degrees towards a-plane. The laser diode cavity isoriented in the projection of the c-direction and also uses cleavedfacet mirrors. In other embodiments, the miscut or off-cut may be withinabout 1 to 5 degrees towards the a-plane. Depending upon the embodiment,the laser diode is operable in at least the 390-410 nm, 410-430 nm,430-450 nm, 450-480 nm, 480-510 nm, 510-540 nm, 540-600 nm ranges. Inother embodiments, the present method and structure can also be appliedto light emitting diode devices, commonly known as LEDs.

The invention provides an alternative optical device with a gallium andnitrogen containing substrate member having a {20-21} crystallinesurface region. The device also has a laser stripe region formedoverlying a portion of the {20-21} crystalline orientation surfaceregion. In a specific embodiment, the laser stripe region ischaracterized by a cavity orientation substantially parallel to aprojection in the c-direction, and has a first end and a second end. Thedevice has at least a first cleaved facet provided on the first end ofthe laser stripe region and a second cleaved facet provided on thesecond end of the laser stripe region.

In an alternative embodiment, the invention provides a method forforming an optical device, e.g., laser. The method includes providing agallium and nitrogen containing substrate member having a {20-21}crystalline surface region. The method forms a laser stripe regionoverlying a portion of the {20-21} crystalline orientation surfaceregion. The laser stripe region is characterized by a cavity orientationsubstantially parallel to a projection in the c-direction. The laserstrip region has a first end and a second end where a pair of facets areformed by cleaving.

In other embodiments, the present invention provides an optical devicewith a gallium and nitrogen containing substrate member having a {30-31}crystalline surface region and a laser stripe region formed overlying aportion of the {30-31} crystalline orientation surface region. The laserstripe region is characterized by a cavity orientation substantiallyparallel to a projection in the c-direction. The device also includes afirst cleaved facet provided on the first end of the laser stripe regionand a second cleaved facet provided on the second end of the laserstripe region.

Still further, the present invention provides a method for forming anoptical device. The method includes providing a gallium and nitrogencontaining substrate member having a {30-31} crystalline surface region.The method forms a laser stripe region overlying a portion of the{30-31} crystalline orientation surface region, the laser stripe regionbeing characterized by a cavity orientation substantially parallel to aprojection in a c-direction. The method includes forming a pair offacets comprising a first cleaved facet provided on the first end of thelaser stripe region and a second cleaved facet provided on the secondend of the laser stripe region. In a preferred embodiment, the firstcleaved facet includes a reflective coating and the second cleaved facetcomprises no coating, an antireflective coating, or exposes gallium andnitrogen containing material.

Moreover, the invention provides an optical device that is substantiallyfree from aluminum bearing cladding materials. The device has a galliumand nitrogen containing substrate member having a {20-21} crystallinesurface region. The device has an n-type gallium and nitrogen containingcladding material. The n-type gallium and nitrogen containing claddingmaterial is preferably substantially free from an aluminum species,which otherwise could lead to imperfections, defects, and otherlimitations. The device also has an active region including multiplequantum well structures overlying the n-type gallium and nitrogencontaining cladding material. The device has a p-type gallium andnitrogen containing cladding material overlying the active region. In apreferred embodiment, the p-type gallium and nitrogen containingcladding material is substantially free from an aluminum species. Thedevice preferably includes a laser stripe region configured from atleast the active region and characterized by a cavity orientationsubstantially parallel to a projection in a c-direction. The laser stripregion has a first end and a second end. The device also has a firstcleaved facet provided on the first end of the laser stripe region and asecond cleaved facet provided on the second end of the laser striperegion. In yet other embodiments, the present device includes a galliumand nitrogen containing electron blocking region that is substantiallyfree from aluminum species. In yet other embodiments, the device doesnot include any electron blocking layer or yet in other embodiments,there is no aluminum in the cladding layers and/or electron blockinglayer.

In preferred embodiments, the present method and structure issubstantially free from InAlGaN or aluminum bearing species in thecladding layers as conventional techniques, such as those in Yoshizumiet al., “Continuous-Wave Operation of 520 nm Green InGaN-Based LaserDiodes on Semi-Polar {20-21} GaN Substrates,” Applied Physics Express 2(2009) 092101. Aluminum is generally detrimental. Aluminum often leadsto introduction of oxygen in the reactor, which can act as non radiativerecombination centers to reduce the radiative efficiency and introduceother limitations. We also determined that oxygen can compensate p-typedopants in the p-cladding to cause additional resistivity in the opticaldevice. We also determined that aluminum is detrimental to the MOCVDreactor and can react or pre-react with other growth precursors. Use ofaluminum cladding layers is cumbersome and can take additional time togrow. Accordingly, it is believed that the aluminum cladding free lasermethod and structure are generally more efficient to grow thanconventional laser structures.

The present invention enables a cost-effective optical device for laserapplications. The optical device can be manufactured in a relativelysimple and cost effective manner using commercially available equipment.The laser device uses a semipolar gallium nitride material to achieve agreen laser device. In one or more embodiments, the laser device iscapable of emitting long wavelengths such as those ranging from about480 nm to greater than about 540 nm and from 430 nm to greater thanabout 480 nm, as well as others. In a specific embodiment, the presentmethod and structure uses a top-side skip and scribe technique forimproved cleaves in the laser device structure. The invention provides amethod using a top side skip-scribe technique for good facets in theprojection of the c-direction.

A further understanding of the nature and advantages of the presentinvention may be realized by reference to the latter portions of thespecification and attached drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a simplified perspective view of a laser device fabricated onthe {20-21} plane gallium and nitrogen containing substrate according toan embodiment of the present invention.

FIG. 2 is a detailed cross-sectional view of a laser device fabricatedon the {20-21} plane gallium and nitrogen containing substrate accordingto an embodiment of the present invention.

FIG. 3 is a simplified diagram illustrating an epitaxial laser structureaccording to an embodiment of the present invention.

FIGS. 3A through 3C are simplified diagrams illustrating epitaxial laserstructures according to other embodiments of the present invention.

FIGS. 4 and 5 are photographs of cleaved facets for the device of FIG. 1according to one or more embodiments of the present invention.

FIG. 6 is a simplified perspective view of an alternative laser devicefabricated on a gallium and nitrogen containing substrate according toan embodiment of the present invention.

FIG. 7 is a photograph of cleaved facets for the device of FIG. 6according to one or more embodiments of the present invention.

FIGS. 8 to 15 illustrate a simplified backend processing method of alaser device according to one or more embodiments of the presentinvention.

FIG. 16 is a simplified plot illustrating light output voltagecharacteristics of laser stripes according to an embodiment of thepresent invention.

FIG. 17 is a simplified plot illustrating light output voltagecharacteristics of laser stripes according to a preferred embodiment ofthe present invention.

FIG. 18 is a simplified plot of voltage and light characteristics of a515 nm laser device according to an embodiment of the present invention.

FIG. 19 is a simplified plot of voltage and light characteristics of acontinuous wave 525 nm laser device according to an embodiment of thepresent invention.

FIG. 20 is a simplified plot of voltage and light characteristics of acontinuous wave 520 nm laser device operable at 45 mWatts according toan embodiment of the present invention.

DETAILED DESCRIPTION OF THE INVENTION

We have explored epitaxial growth and cleave properties on semipolarcrystal planes oriented between the nonpolar m-plane and the polarc-plane. In particular, we have grown on the {30-31} and {20-21}families of crystal planes. We have achieved epitaxy structures andcleaves that create a path to efficient laser diodes operating atwavelengths from about 400 nm to green, e.g., 500 nm to 540 nm. Theseresults include bright blue epitaxy in the 450 nm range, bright greenepitaxy in the 520 nm range, and smooth naturally occurring cleaveplanes orthogonal to the projection of the c-direction. It is desirableto align the laser cavities parallel to the projection of thec-direction for maximum gain on this family of crystal planes.

Although it was believed that a higher gain would be offered in theprojection of the c-direction than would be available in thea-direction, it is also desirable to form a high quality cleavage planeorthogonal to a stripe oriented in the projection of the c-direction.More specifically, we desired a high quality cleavage plane orthogonalto the [10-1-7] for a laser stripe formed on the {20-21} plane. In oneor more preferred embodiments, we determined a high quality cleave planesubstantially orthogonal to the projection of the c-direction, [10⁻¹-7].In particular, we determined that if a top side skip-scribe scribingtechnique is used followed by a break step a high quality smooth andvertical cleaved facet would be formed on the upper portion of thecleave face according to one or more embodiments. Below the upperportion of the cleave face the facet becomes angled, which may not beoptimum for a laser diode mirror according to one or more embodiments.In other embodiments, however, such angled cleave characteristic isdesirable for laser fabrication since the laser mirror will bepositioned on top of the substrate where the cleave face is vertical. Inone or more embodiments, when the sample is back side laser scribed andthen broken, an angled, but smooth cleave face is formed. Such a smoothcleave face may be desirable for lasers, but it is not the mostpreferable since the laser mirror will be tilted. The top-side skipscribe technique looks more preferably according to one or moreembodiments. Further details of the scribing and breaking technique canbe found below.

FIG. 1 is a simplified perspective view of a laser device 100 fabricatedon an off-cut m-plane {20-21} substrate according to an embodiment ofthe present invention. This diagram is merely an example, which shouldnot unduly limit the scope of the claims herein. One of ordinary skillin the art would recognize other variations, modifications, andalternatives. As shown, the optical device includes a gallium nitridesubstrate member 101 having the off-cut m-plane crystalline surfaceregion. In a specific embodiment, the gallium nitride substrate memberis a bulk GaN substrate characterized by having a semipolar or non-polarcrystalline surface region, but can be others. In a specific embodiment,the bulk nitride GaN substrate comprises nitrogen and has a surfacedislocation density between about 10⁵ cm⁻² and about 10⁷ cm⁻² or below10⁵ cm⁻². The nitride crystal or wafer may compriseAl_(x)In_(y)Ga_(1-x-y)N, where 0≦x, y, x+y≦1. In one specificembodiment, the nitride crystal comprises GaN. In one or moreembodiments, the GaN substrate has threading dislocations, at aconcentration between about 10⁵ cm⁻² and about 10⁸ cm⁻², in a directionthat is substantially orthogonal or oblique with respect to the surface.As a consequence of the orthogonal or oblique orientation of thedislocations, the surface dislocation density is between about 10⁵ cm²and about 10⁷ cm⁻² or below about 10⁵ cm⁻². In a specific embodiment,the device can be fabricated on a slightly off-cut semipolar substrateas described in U.S. Ser. No. 12/749,466 filed Mar. 29, 2010, whichclaims priority to U.S. Provisional No. 61/164,409 filed Mar. 28, 2009,commonly assigned, and hereby incorporated by reference herein.

In a specific embodiment on the {20-21} GaN, the device has a laserstripe region formed overlying a portion of the off-cut crystallineorientation surface region. In a specific embodiment, the laser striperegion is characterized by a cavity orientation substantially in aprojection of a c-direction, which is substantially normal to ana-direction. In a specific embodiment, the laser strip region has afirst end 107 and a second end 109. In a preferred embodiment, thedevice is formed on a projection of a c-direction on a {20-21} galliumand nitrogen containing substrate having a pair of cleaved mirrorstructures, which face each other. In a preferred embodiment, the firstcleaved facet comprises a reflective coating and the second cleavedfacet comprises no coating, an antireflective coating, or exposesgallium and nitrogen containing material.

In a preferred embodiment, the device has a first cleaved facet providedon the first end of the laser stripe region and a second cleaved facetprovided on the second end of the laser stripe region. In one or moreembodiments, the first cleaved is substantially parallel with the secondcleaved facet. Mirror surfaces are formed on each of the cleavedsurfaces. The first cleaved facet comprises a first mirror surface. In apreferred embodiment, the first mirror surface is provided by a top-sideskip-scribe scribing and breaking process. The scribing process can useany suitable techniques, such as a diamond scribe or laser scribe orcombinations. In a specific embodiment, the first mirror surfacecomprises a reflective coating. The reflective coating is selected fromsilicon dioxide, hafnia, and titania, tantalum pentoxide, zirconia,including combinations, and the like. Depending upon the embodiment, thefirst mirror surface can also comprise an anti-reflective coating.

Also in a preferred embodiment, the second cleaved facet comprises asecond mirror surface. The second mirror surface is provided by a topside skip-scribe scribing and breaking process according to a specificembodiment. Preferably, the scribing is diamond scribed or laser scribedor the like. In a specific embodiment, the second mirror surfacecomprises a reflective coating, such as silicon dioxide, hafnia, andtitania, tantalum pentoxide, zirconia, combinations, and the like. In aspecific embodiment, the second mirror surface comprises ananti-reflective coating.

In a specific embodiment, the laser stripe has a length and width. Thelength ranges from about 50 microns to about 3000 microns, but ispreferably between 400 microns and 1000 microns. The stripe also has awidth ranging from about 0.5 microns to about 50 microns, but ispreferably between 0.8 microns and 3 microns, but can be otherdimensions. In a specific embodiment, the present device has a widthranging from about 0.5 microns to about 1.5 microns, a width rangingfrom about 1.5 microns to about 3.0 microns, and others. In a specificembodiment, the width is substantially constant in dimension, althoughthere may be slight variations. The width and length are often formedusing a masking and etching process, which are commonly used in the art.

In a specific embodiment, the present invention provides an alternativedevice structure capable of emitting 501 nm and greater light in a ridgelaser embodiment. The device is provided with one or more of thefollowing epitaxially grown elements, but is not limiting.

an n-GaN cladding layer with a thickness from 100 nm to 3000 nm with Sidoping level of 5E17 to 3E18 cm-3

an n-side SCH layer comprised of InGaN with molar fraction of indium ofbetween 2% and 10% and thickness from 20 to 150 nm

multiple quantum well active region layers comprised of five 3.0-5.5.0nm InGaN quantum wells separated by six 4.0-10.0 nm GaN barriers

a p-side SCH layer comprised of InGaN with molar a fraction of indium ofbetween 1% and 10% and a thickness from 15 nm to 100 nm

an electron blocking layer comprised of AlGaN with molar fraction ofaluminum of between 5% and 20% and thickness from 10 nm to 15 nm anddoped with Mg.

a p-GaN cladding layer with a thickness from 400 nm to 1000 nm with Mgdoping level of 5E17 cm-3 to 1E19 cm-3

a p++-GaN contact layer with a thickness from 20 nm to 40 nm with Mgdoping level of 1E20 cm-3 to 1E21 cm-3

In a specific embodiment, the laser device is fabricated on a {20-21}substrate. Further details of the present device can be found throughoutthe present specification and more particularly below.

FIG. 2 is a detailed cross-sectional view of a laser device 200fabricated on a {20-21} substrate according to an embodiment of thepresent invention. This diagram is merely an example, which should notunduly limit the scope of the claims herein. One of ordinary skill inthe art would recognize other variations, modifications, andalternatives. As shown, the laser device includes gallium nitridesubstrate 203, which has an underlying n-type metal back contact region201. In a specific embodiment, the metal back contact region is made ofa suitable material such as those noted below and others. Furtherdetails of the contact region can be found throughout the presentspecification and more particularly below.

In a specific embodiment, the device also has an overlying n-typegallium nitride layer 205, an active region 207, and an overlying p-typegallium nitride layer structured as a laser stripe region 209. In aspecific embodiment, each of these regions is formed using at least anepitaxial deposition technique of metal organic chemical vapordeposition (MOCVD), molecular beam epitaxy (MBE), or other epitaxialgrowth techniques suitable for GaN growth. In a specific embodiment, theepitaxial layer is a high quality epitaxial layer overlying the n-typegallium nitride layer. In some embodiments the high quality layer isdoped, for example, with Si or O to form n-type material, with a dopantconcentration between about 10¹⁶ cm⁻³ and 10²⁰ cm⁻³.

In a specific embodiment, an n-type Al_(u)In_(v)Ga_(1-u-v)N layer, where0≦u, v, u+v≦1, is deposited on the substrate. In a specific embodiment,the carrier concentration may lie in the range between about 10¹⁶ cm⁻³and 10²⁰ cm⁻³. The deposition may be performed using metalorganicchemical vapor deposition (MOCVD) or molecular beam epitaxy (MBE).

As an example, the bulk GaN substrate is placed on a susceptor in anMOCVD reactor. After closing, evacuating, and back-filling the reactor(or using a load lock configuration) to atmospheric pressure, thesusceptor is heated to a temperature between about 1000 and about 1200degrees Celsius in the presence of a nitrogen-containing gas. In onespecific embodiment, the susceptor is heated to approximately 900 to1100 degrees Celsius under flowing ammonia. A flow of agallium-containing metalorganic precursor, such as trimethylgallium(TMG) or triethylgallium (TEG) is initiated, in a carrier gas, at atotal rate between approximately 1 and 50 standard cubic centimeters perminute (sccm). The carrier gas may comprise hydrogen, helium, nitrogen,or argon. The ratio of the flow rate of the group V precursor (ammonia)to that of the group III precursor (trimethylgallium, triethylgallium,trimethylindium, trimethylaluminum) during growth is between about 2000and about 15000. A flow of disilane in a carrier gas, with a total flowrate of between about 0.1 and 10 sccm, is initiated.

In a specific embodiment, the laser stripe region is made of the p-typegallium nitride layer 209. In a specific embodiment, the laser stripe isprovided by an etching process selected from dry etching or wet etching.In a preferred embodiment, the etching process is dry, but can beothers. As an example, the dry etching process is an inductively coupledprocess using chlorine bearing species or a reactive ion etching processusing similar chemistries. Again as an example, the chlorine bearingspecies are commonly derived from chlorine gas or the like. The devicealso has an overlying dielectric region, which exposes 213 contactregion. In a specific embodiment, the dielectric region is an oxide suchas silicon dioxide or silicon nitride, but can be others. The contactregion is coupled to an overlying metal layer 215. The overlying metallayer is a multilayered structure containing gold and platinum (Pt/Au)or nickel and gold (Ni/Au), but can be others.

In a specific embodiment, the laser device has active region 207. Theactive region can include one to twenty quantum well regions accordingto one or more embodiments. As an example following deposition of then-type Al_(u)In_(v)Ga_(1-u-v)N layer for a predetermined period of time,so as to achieve a predetermined thickness, an active layer isdeposited. The active layer may comprise a single quantum well or amultiple quantum well, with 2-10 quantum wells. The quantum wells maycomprise InGaN wells and GaN barrier layers. In other embodiments, thewell layers and barrier layers comprise Al_(w)In_(x)Ga_(1-w-x)N andAl_(y)In_(z)Ga_(1-y-z)N, respectively, where 0≦w, x, y, z, w+x, y+z≦1,where w<u, y and/or x>v, z so that the bandgap of the well layer(s) isless than that of the barrier layer(s) and the n-type layer. The welllayers and barrier layers may each have a thickness between about 1 nmand about 15 nm. In another embodiment, the active layer comprises adouble heterostructure, with an InGaN or Al_(w)In_(x)Ga_(1-w-x)N layerabout 10 nm to 100 nm thick surrounded by GaN or Al_(y)In_(z)Ga_(1-y-z)Nlayers, where w<u, y and/or x>v, z. The composition and structure of theactive layer are chosen to provide light emission at a preselectedwavelength. The active layer may be left undoped (or unintentionallydoped) or may be doped n-type or p-type.

In a specific embodiment, the active region can also include an electronblocking region, and a separate confinement heterostructure. In someembodiments, an electron blocking layer is preferably deposited. Theelectron-blocking layer may comprise Al_(s)In_(t)Ga_(1-s-t)N, where 0≦s,t, s+t≦1, with a higher bandgap than the active layer, and may be dopedp-type. In one specific embodiment, the electron blocking layercomprises AlGaN. In another embodiment, the electron blocking layercomprises an AlGaN/GaN super-lattice structure, comprising alternatinglayers of AlGaN and GaN, each with a thickness between about 0.2 nm andabout 5 nm. In another embodiment the electron blocking layer comprisesInAlGaN. In yet another embodiment there is not electron blocking layer.In

As noted, the p-type gallium nitride structure, is deposited above theelectron blocking layer and active layer(s). The p-type layer may bedoped with Mg, to a level between about 10¹⁶ cm⁻³ and 10²² cm⁻³, and mayhave a thickness between about 5 nm and about 1000 nm. The outermost1-50 nm of the p-type layer may be doped more heavily than the rest ofthe layer, so as to enable an improved electrical contact. In a specificembodiment, the laser stripe is provided by an etching process selectedfrom dry etching or wet etching. In a preferred embodiment, the etchingprocess is dry, but can be others. The device also has an overlyingdielectric region, which exposes 213 contact region. In a specificembodiment, the dielectric region is an oxide such as silicon dioxide,but can be others.

In a specific embodiment, the metal contact is made of suitablematerial. The reflective electrical contact may comprise at least one ofsilver, gold, aluminum, nickel, platinum, rhodium, palladium, chromium,or the like. The electrical contact may be deposited by thermalevaporation, electron beam evaporation, electroplating, sputtering, oranother suitable technique. In a preferred embodiment, the electricalcontact serves as a p-type electrode for the optical device. In anotherembodiment, the electrical contact serves as an n-type electrode for theoptical device. Further details of the cleaved facets can be foundthroughout the present specification and more particularly below.

FIG. 3 is a simplified diagram illustrating a laser structure accordingto a preferred embodiment of the present invention. This diagram ismerely an example, which should not unduly limit the scope of the claimsherein. One of ordinary skill in the art would recognize othervariations, modifications, and alternatives. In a specific embodiment,the device includes a starting material such as a bulk nonpolar orsemipolar GaN substrate, but can be others. In a specific embodiment,the device is configured to achieve emission wavelength ranges of 390 nmto 420 nm, 420 nm to 440 nm, 440 nm to 470 nm, 470 nm to 490 nm, 490 nmto 510 nm, and 510 nm to 530 nm, but can be others.

In a preferred embodiment, the growth structure is configured usingbetween 3 and 5 or 5 and 7 quantum wells positioned between n-type GaNand p-type GaN cladding layers. In a specific embodiment, the n-type GaNcladding layer ranges in thickness from 500 nm to 4000 nm and has ann-type dopant such as Si with a doping level of between 5E17 cm-3 and3E18 cm-3. In a specific embodiment, the p-type GaN cladding layerranges in thickness from 400 nm to 1000 nm and has a p-type dopant suchas Mg with a doping level of between 1E17 cm-3 and 5E19 cm-3. In aspecific embodiment, the Mg doping level is graded such that theconcentration would be lower in the region closer to the quantum wells.

In a specific preferred embodiment, the quantum wells have a thicknessof between 3 nm and 5.5 nm or 5.5 nm and 8 nm, but can be others. In aspecific embodiment, the quantum wells would be separated by barrierlayers with thicknesses between 3 nm and 5 nm, 5 nm and 10 nm, or 10 nmand 15 nm. In other embodiments, the barrier layer can be configuredwith a thickness of about 1.5 nm to about 4 nm, although there may besome slight variations. The quantum wells and the barriers togethercomprise a multiple quantum well (MQW) region.

In a preferred embodiment, the device has barrier layers formed fromGaN, InGaN, AlGaN, or InAlGaN. In a specific embodiment using InGaNbarriers, the indium contents range from 0% to 5% (mole percent), butcan be others. Also, it should be noted that % of indium or aluminum isin a molar fraction, not weight percent.

An InGaN separate confinement hetereostructure layer (SCH) could bepositioned between the n-type GaN cladding and the MQW region accordingto one or more embodiments. Typically, such separate confinement layeris commonly called the n-side SCH. The n-side SCH layer ranges inthickness from 10 nm to 50 nm, 50 nm to 100 nm, or 100 nm to 200 nm andranges in indium composition from 1% to 10% (mole percent), but can beothers. In a specific embodiment the n-side SCH is comprised of morethan one layer of InGaN, where the multiple layers could have variedindium concentrations. In a specific embodiment, the n-side SCH layermay or may not be doped with an n-type dopant such as Si. In a specificembodiment, the n-side SCH is comprised of more than one layer withdifferent indium compositions or even graded indium compositions orothers.

In yet another preferred embodiment, an InGaN separate confinementhetereostructure layer (SCH) is positioned between the p-type GaNcladding and the MQW region, which is called the p-side SCH. In aspecific embodiment, the p-side SCH layer ranges in thickness from 10 nmto 50 nm or 50 nm to 100 nm and ranges in indium composition from 1% to10% (mole percent), but can be others. The p-side SCH layer may or maynot be doped with a p-type dopant such as Mg. In another embodiment, thestructure would contain both an n-side SCH and a p-side SCH.

In yet another preferred embodiment, an GaN p-side guiding layer ispositioned between the p-type GaN cladding and the MQW region. In aspecific embodiment, the p-side guiding layer ranges in thickness from10 nm to 50 nm or 50 nm to 100 nm. The p-side guiding layer may or maynot be doped with a p-type dopant such as Mg.

In a specific preferred embodiment, an AlGaN electron blocking layer,with an aluminum content of between 5% and 20% (mole percent), ispositioned between the MQW and the p-type GaN cladding layer eitherbetween the MQW and the p-side SCH, within the p-side SCH, or betweenthe p-side SCH and the p-type GaN cladding. The AlGaN electron blockinglayer ranges in thickness from 10 nm to 20 nm and is doped with a p-typedopant such as Mg from 1E18 cm-3 and 1E20 cm-3 according to a specificembodiment. In other embodiments, the electron blocking layer is freefrom any aluminum species and/or may be eliminated all together. In yetanother embodiment, the device would be substantially free from anelectron blocking layer.

Preferably, a p-contact layer positioned on top of and is formedoverlying the p-type cladding layer. The p-contact layer would becomprised of GaN doped with a p-dopant such as Mg at a level rangingfrom 1E20 cm-3 to 1E22 cm-3.

FIGS. 3A through 3C are simplified diagrams illustrating epitaxial laserstructures according to other embodiments of the present invention. In apreferred embodiment, the present invention provides an optical devicethat is substantially free from aluminum bearing cladding materials andother regions, e.g., electron blocking region. In a specific embodiment,the substantially free from aluminum material may include slight amountsof aluminum materials ranging from a fraction of a percent to about afew percent, e.g., 2-3%, less than 2%. The device has a gallium andnitrogen containing substrate member (e.g., bulk gallium nitride) havinga {20-21} crystalline surface region or other surface configuration. Thedevice has an n-type gallium and nitrogen containing cladding material.In a specific embodiment, the n-type gallium and nitrogen containingcladding material is substantially free from an aluminum species, whichleads to imperfections, defects, and other limitations. In one or morepreferred embodiment, the cladding material has no aluminum species andis made of a gallium and nitrogen containing material.

In a specific embodiment, the device also has an active region includingmultiple quantum well structures overlying the n-type gallium andnitrogen containing cladding material. In one or more embodiments, theactive regions can include those noted, as well as others. That is, thedevice can include InGaN/InGaN and/or InGaN/GaN active regions, amongothers. In a specific embodiment, the optical can include seven MQW,five MQW, three MQW, more MQW, or fewer, and the like.

In a specific embodiment, the device has a p-type gallium and nitrogencontaining cladding material overlying the active region. In a preferredembodiment, the p-type gallium and nitrogen containing cladding materialis substantially free from an aluminum species, which leads toimperfections, defects, and other limitations. In a specific embodiment,there may be a slight amount of aluminum such as 2% and less or 1% andless in the cladding and/or electron blocking regions. In one or morepreferred embodiment, the cladding material has no aluminum species andis made of a gallium and nitrogen containing material.

In a specific embodiment, the device preferably includes a laser striperegion configured from at least the active region and characterized by acavity orientation substantially parallel to a projection in ac-direction. Other configurations may also exist depending upon thespecific embodiment. The laser strip region has a first end and a secondend or other configurations. In a specific embodiment, the device alsohas a first cleaved facet provided on the first end of the laser striperegion and a second cleaved facet provided on the second end of thelaser stripe region.

In yet other embodiments, the present device includes a gallium andnitrogen containing electron blocking region that is substantially freefrom aluminum species. In yet other embodiments, the device does notinclude any electron blocking layer or yet in other embodiments, thereis no aluminum in the cladding layers and/or electron blocking layer. Instill other embodiments, the optical device and method are free from anyaluminum material, which leads to defects, imperfections, and the like.Further details of these limitations can be found throughout the presentspecification and more particularly below.

In preferred embodiments, the present method and structure issubstantially free from InAlGaN or aluminum bearing species in thecladding layers as conventional techniques, such as those in Yoshizumiet al., “Continuous-Wave operation of 520 nm Green InGaN-Based LaserDiodes on Semi-Polar {20-21} GaN Substrates,” Applied Physics Express 2(2009) 092101. That is, the present laser structure and method aresubstantially free from any aluminum species in the cladding region.Aluminum is generally detrimental. Aluminum often leads to introductionof oxygen in the reactor, which can act as non radiative recombinationcenters to reduce the radiative efficiency and introduce otherlimitations. We also determined that oxygen can compensate p-typedopants in the p-cladding to cause additional resistivity in the opticaldevice. In other aspects, we also determined that aluminum isdetrimental to the MOCVD reactor and can react or pre-react with othergrowth precursors. Use of aluminum cladding layers is also cumbersomeand can take additional time to grow. Accordingly, it is believed thatthe aluminum cladding free laser method and structure are generally moreefficient to grow than conventional laser structures.

FIGS. 4 and 5 are photographs of cleaved facets for the device of FIG. 1according to one or more embodiments of the present invention. Thesephotographs are merely examples, and should not unduly limit the scopeof the claims herein. One of ordinary skill in the art would recognizeother variations, modifications, and alternatives.

FIG. 6 is a simplified perspective view of an alternative laser devicefabricated on a gallium and nitrogen containing substrate according toan embodiment of the present invention. This diagram is merely anexample, which should not unduly limit the scope of the claims herein.One of ordinary skill in the art would recognize other variations,modifications, and alternatives. As shown, the optical device includes agallium and nitrogen containing substrate member 601 having the off-cutm-plane crystalline surface region according to one or more embodiments.In a specific embodiment, the gallium nitride substrate member is a bulkGaN substrate characterized by having a semipolar or non-polarcrystalline surface region, but can be others. In a specific embodiment,the bulk nitride GaN substrate comprises nitrogen and has a surfacedislocation density of between about 10⁵ cm⁻² and 10⁷ cm⁻² or below 10⁵cm⁻². The nitride crystal or wafer may comprise Al_(x)In_(y)Ga_(1-x-y)N,where 0≦x, y, x+y≦1. In one specific embodiment, the nitride crystalcomprises GaN. In one or more embodiments, the GaN substrate hasthreading dislocations, at a concentration between about 10⁵ cm⁻² andabout 10⁸ cm⁻², in a direction that is substantially orthogonal oroblique with respect to the surface. As a consequence of the orthogonalor oblique orientation of the dislocations, the surface dislocationdensity is between about 10⁵ cm⁻² and 10⁸ cm⁻² or below about 10⁵ cm⁻².

In a specific embodiment on the off-cut GaN, the device has a laserstripe region formed overlying a portion of the off-cut crystallineorientation surface region. In a specific embodiment, the laser striperegion is characterized by a cavity orientation substantially in aprojection of a c-direction, which is substantially normal to ana-direction. In a specific embodiment, the laser stripe region has afirst end 607 and a second end 609. In a preferred embodiment, thedevice is formed on a projection of a c-direction on a {30-31} galliumand nitrogen containing substrate having a pair of cleaved mirrorstructures, which face each other.

In a preferred embodiment, the device has a first cleaved facet providedon the first end of the laser stripe region and a second cleaved facetprovided on the second end of the laser stripe region. In one or moreembodiments, the first cleaved is substantially parallel with the secondcleaved facet. Mirror surfaces are formed on each of the cleavedsurfaces. The first cleaved facet comprises a first mirror surface. In apreferred embodiment, the first mirror surface is provided by a scribingand breaking process. The scribing process can use any suitabletechniques, such as a diamond scribe or laser scribe or combinations. Ina specific embodiment, the first mirror surface comprises a reflectivecoating. The reflective coating is selected from silicon dioxide,hafnia, and titania, tantalum pentoxide, zirconia, includingcombinations, and the like. Depending upon the embodiment, the firstmirror surface can also comprise an anti-reflective coating.

Also in a preferred embodiment, the second cleaved facet comprises asecond mirror surface. The second mirror surface is provided by ascribing and breaking process according to a specific embodiment.Preferably, the scribing is diamond scribed or laser scribed or thelike. In a specific embodiment, the second mirror surface comprises areflective coating, such as silicon dioxide, hafnia, and titania,tantalum pentoxide, zirconia, combinations, and the like. In a preferredembodiment, the first cleaved facet comprises a reflective coating andthe second cleaved facet comprises no coating, an antireflectivecoating, or exposes gallium and nitrogen containing material. In aspecific embodiment, the second mirror surface comprises ananti-reflective coating.

In a specific embodiment, the laser stripe has a length and width. Thelength ranges from about 50 microns to about 3000 microns, but ispreferably between 400 microns and about 1000 microns. The strip alsohas a width ranging from about 0.5 microns to about 50 microns, but ispreferably between 0.8 microns and 3 microns and can be otherdimensions. In a specific embodiment, the width is substantiallyconstant in dimension, although there may be slight variations. Thewidth and length are often formed using a masking and etching process,which are commonly used in the art. Further details of the presentdevice can be found throughout the present specification and moreparticularly below.

FIG. 7 is a photograph of cleaved facets for the device of FIG. 5according to one or more embodiments of the present invention. Thisphotograph is merely an example, and should not unduly limit the scopeof the claims herein. One of ordinary skill in the art would recognizeother variations, modifications, and alternatives.

A method of processing a laser device according to one or moreembodiments may be outline as follows, see also FIG. 8:

-   -   1. Start;    -   2. Provide processed substrate including laser devices with        ridges;    -   3. Thin substrate from backside;    -   4. Form backside n-contact;    -   5. Scribe pattern for separation of the laser devices configured        in bar structures;    -   6. Break scribed pattern to form a plurality of bar structures;    -   7. Stack bar structures;    -   8. Coat bars structures;    -   9. Singulate bar structures into individual dies having laser        device; and    -   10. Perform other steps as desired.

The above sequence of steps is used to form individual laser devices ona die from a substrate structure according to one or more embodiments ofthe present invention. In one or more preferred embodiments, the methodincludes cleaved facets substantially parallel to each other and facingeach other in a ridge laser device configured on a non-polar galliumnitride substrate material. Depending upon the embodiment, one or moreof these steps can be combined, or removed, or other steps may be addedwithout departing from the scope of the claims herein.

FIG. 9 is a simplified illustrating of a substrate thinning processaccording to an embodiment of the present invention. This diagram ismerely an illustration and should not unduly limit the scope of theclaims herein. One of ordinary skill in the art would recognize othervariations, modifications, and alternatives. In a specific embodiment,the method begins with a gallium nitride substrate material includinglaser devices and preferably ridge laser devices, but can be others. Thesubstrate has been subjected to front side processing according to aspecific embodiment. After front side processing has been completed, oneor more of the GaN substrates are mounted onto a sapphire carrier waferor other suitable member. As an example, the method uses Crystalbond909, which is a conventional mounting thermoplastic. The thermoplasticcan be dissolved in acetone or other suitable solvent.

In a specific embodiment, the carrier wafer is mounted to a lapping jig.An example of such lapping jig is made by Logitech Ltd. of the UnitedKingdom, or other vendor. The lapping jig helps maintain planarity ofthe substrates during the lapping process according to a specificembodiment. As an example, the starting thickness of the substrates are˜325 um+/−20 um, but can be others. In a specific embodiment, the methodlaps or thins the substrates down to 50-80 um thickness, but can also bethinner or slightly thicker. In a preferred embodiment, the lapping jigis configured with a lapping plate, which is often made of a suitablematerial such as cast iron configured with a flatness of less than 5 um,but can be others. Preferably, the method uses a lapping slurry that is1 part silicon carbide (SiC) and 10 parts water, but can also be othervariations. In a specific embodiment, the SiC grit is about 5 um indimension. In one or more embodiments, the lapping plate speed issuitable at about 10 revolutions per minute. Additionally, the methodcan adjust the lapping jig's down pressure to achieve a desired lappingrate, such as 2-3 um/min or greater or slightly less.

In a specific embodiment, the present method includes a lapping processthat may produce subsurface damage in the GaN material to causegeneration of mid level traps or the like. The midlevel traps may leadto contacts having a Schottky characteristic. Accordingly, the presentmethod includes one or more polishing processes such that ˜10 um ofmaterial having the damage is removed according to a specificembodiment. As an example, the method uses a Politex™ polishing pad ofRohm and Haas, but can be others, that is glued onto a stainless steelplate. A polishing solution is Ultraso1300K manufactured by EminessTechnologies, but can be others. The Ultra-Sol 300K is a high-puritycolloidal silica slurry with a specially designed alkaline dispersion.It contains 70 nm colloidal silica and has a pH of 10.6. The solidscontent is 30% (by weight). In a specific embodiment, the lapping platespeed is 70 rpm and the full weight of the lapping jig is applied. In apreferred embodiment, the method includes a polishing rate of about ˜2um/hour.

In other embodiments, the present invention provides a method forachieving high quality n-type contacts for m-plane GaN substratematerial. In a specific embodiment, the method provides contacts thatare rough to achieve suitable ohmic contact. In a specific embodiment,the roughness causes exposure of other crystal planes, which lead togood contacts. In a preferred embodiment, the present method includes alapped surface, which is rough in texture to expose more than one ormultiple different crystal planes. In other embodiments, lapping may befollowed by etching such as dry etching and/or wet etching. In aspecific embodiment, etching removes the subsurface damage, however, itis likely not to planarize the surface as well as polishing.

FIG. 10 is a simplified diagram illustrating a backside n-contact methodaccording to one or more embodiments. This diagram is merely anillustration and should not unduly limit the scope of the claims herein.One of ordinary skill in the art would recognize other variations,modifications, and alternatives. After the thinning process is complete,the method forms n-contacts on the backside of the substrates accordingto one or more embodiments. At this point, the thinned substrates arestill mounted to and maintained on the sapphire wafer. In a preferredembodiment, the thinned substrates are “batch process” for efficiencyand handling. In a specific embodiment, the method using batchprocessing helps prevent any damage associated with handling very thin(50-80 um) substrates.

As an example, the backside contact includes about 300 Å Al/3000 Å Au orother suitable materials such as Al/Ni/Au. In a specific embodiment, thecontact is a stack of metals that are deposited by e-beam evaporation orother suitable techniques such as sputtering. In a preferred embodimentand prior to the metal stack deposition, the method includes use of awet etch such as an hydrofluoric acid or hydrochloric acid to remove anyoxides on the surface. In a specific embodiment, the metal stack ispreferably not annealed or subjected to high temperature processingafter its formation.

FIG. 11 is a simplified diagram illustrating a scribe and breakoperation according to one or more embodiments. This diagram is merelyan illustration and should not unduly limit the scope of the claimsherein. One of ordinary skill in the art would recognize othervariations, modifications, and alternatives. After the n-contact isformed, the substrates are demounted from the sapphire carrier wafer andcleaned in acetone and isopropyl alcohol according to a specificembodiment. The substrates are then mounted onto vinyl tape for thescribe and break process depending upon the embodiment. In a preferredembodiment, the tape does not leave any residue on the laser bars, whichare substantially free from such residues, which are often polymeric innature or particulates.

Next, the method includes one or more scribing processes. In a specificembodiment, the method includes subjecting the substrates to a laser forpattern formation. The pattern is configured for the formation of a pairof facets for one or more ridge lasers. The pair of facets face eachother and are in parallel alignment with each other. In a preferredembodiment, the method uses a UV (355 nm) laser to scribe the laserbars. The scribing can be performed on the back-side, front-side, orboth depending upon the application.

In another embodiment, the method uses backside scribing. With backsidescribing, the method preferably forms a continuous line scribe that isperpendicular to the laser bars on the backside of the GaN substrate.The scribe is generally 15-20 um deep or other suitable depth. Withbackside scribing, the scribe process does not depend on the pitch ofthe laser bars or other like pattern. Thus, backside scribing can leadto a higher density of laser bars on each substrate. backside scribing,however, may lead to residue from the tape on one or more of the facets.Backside scribe often requires that the substrates face down on thetape. With front-side scribing, the backside of the substrate is incontact with the tape.

In a preferred embodiment, the present method uses front-side scribing,which facilitates formation of clean facets. The method includes ascribe pattern to produce straight cleaves with minimal facet roughnessor other imperfections. Further details of scribing are provided below.

Scribe Pattern: The pitch of the laser mask is about 200 um. The methoduses a 170 um scribe with a 30 um dash for the 200 um pitch. The scribelength is maximized or increased while maintaining the heat affectedzone of the laser away from the laser ridge, which is sensitive to heat.

Scribe Profile: A saw tooth profile generally produces minimal facetroughness. It is believed that the saw tooth profile shape creates avery high stress concentration in the material, which causes the cleaveto propagate much easier and/or more efficiently.

The present method provides for a scribe suitable for fabrication of thepresent laser devices. As an example, FIG. 9 illustrates cross-sectionsof substrate materials associated with (1) a backside scribe process;and (2) a front-side scribe process.

Referring now to FIG. 13, the method includes a breaking process to forma plurality of bar structures. This diagram is merely an illustrationand should not unduly limit the scope of the claims herein. One ofordinary skill in the art would recognize other variations,modifications, and alternatives. After the GaN substrates are scribed,the method uses a breaker to cleave the substrates into bars. Thebreaker has a metal support that has a gap spacing of 900 um. Thesubstrate is positioned over the support so that the scribe line iscentered. A suitably sharp ceramic blade then applies pressure directlyon the scribe line, causing the substrate to cleave along the scribeline.

FIG. 14 is a simplified diagram illustrating a stacking and coatingprocess. After cleaving, the bars are stacked in a fixture that allowsfor coating the front facet and back facet, which are in parallelalignment with each other and facing each other. The front facet coatingfilms can be selected from any suitable low reflectance design (ARdesign) or highly reflective coating (HR design). The AR design includesa quarter wave coating of Al₂O₃ capped with a thin layer of HfO₂according to a specific embodiment. The Al₂O₃ coating is a robustdielectric, and HfO₂ is dense, which helps environmentally passivate andtune the reflectance of the front facet. In a specific embodiment, thefront facet is coated with a HR design. The HR design includes severalquarter wave pairs of SiO₂/Ta₂O₅ or SiO₂/HfO₂. In a specific embodiment,roughly 2-5 pairs may be used to achieve a reflectance over 80%. Inanother specific embodiment, the front facet is coated with 1 to 2quarter wave pairs to achieve a reflectance of above 40%. In yet anotherspecific embodiment, the front facet is left uncoated. That is, theuncoated and exposes gallium and nitrogen containing material. Thesecoating films are preferably deposited by e beam evaporation. In aspecific embodiment, the back facet is coated with a high reflectance HRdesign. The HR design includes several quarter wave pairs of SiO₂/Ta₂O₅or SiO₂/HfO₂. Roughly 6-10 pairs may be used to achieve a reflectanceover 99%.

The method uses a suitable deposition system configured for depositionof each of the facets without breaking vacuum. The deposition systemincludes a dome structure with sufficient height and spatial volume. Thesystem allows for the plurality of bars configured in a fixture to beflipped from one side to another side and to expose the back facet andthe front facet according to a specific embodiment. The method allowsfor first deposition of the back facet, reconfiguring the bar fixture toexpose the front facet, and second deposition of the front facet withoutbreaking vacuum. In a preferred embodiment, the method allows fordeposition of one or more films on front and back without breakingvacuum, thereby saving time and improving efficiency.

FIG. 15 illustrates a method directed to singulate bars into a pluralityof die according to a specific embodiment. After the facets of the barshave been coated, the method includes testing the laser devices in barform prior to die singulation. In a specific embodiment, the methodsingulates the bars by performing a scribe and break process (similar tothe facet cleave). Preferably, the method forms a shallow continuousline scribe on the top side of the laser bar according to a specificembodiment. The width of each die is about 200 um, which may reduce thesupport gap to 300 um or so. After the bars have been cleaved intoindividual die, the tape is expanded and each of the die is picked offof the tape. Next, the method performs a packing operation for each ofthe die.

FIG. 16 is a simplified plot illustrating the pulsed light outputvoltage characteristics of laser stripes according to an embodiment ofthe present invention. Shown are the voltage and light output of 1200 μmlong by 1.4 to 2.0 μm wide lasers fabricated on {20-21} with anepitaxial structure oriented in the projection of the c-direction andthe a-direction. The higher optical output power and the demonstrationof a laser device of the projection of the c-direction lasers is anindication that the gain is higher for projection of c-directionoriented lasers. In this example, the device included gallium andnitrogen containing cladding layers that were substantially free fromaluminum species. Of course, there can be other variations,modifications, and alternatives according to other embodiments.

FIG. 17 is a simplified plot illustrating the light output versus pulsedinput current and voltage characteristics of laser stripes according toa preferred embodiment of the present invention. Shown are voltage andlight output of HR coated 1200 μm long by 1.4 to 2.0 μm wide lasersfabricated on {20-21} with an epitaxial structure oriented in theprojection of the c-direction and the a-direction according to preferredembodiments of the present invention. The lower threshold currents andhigher slope efficiency of the projection of the c-direction lasers isan indication that the gain characteristic is favorable for projectionof c-direction oriented lasers. In this example, the device includedgallium and nitrogen containing cladding layers that were substantiallyfree from aluminum species. Of course, there can be other variations,modifications, and alternatives according to other embodiments.

FIG. 18 is a simplified plot of pulsed voltage and current versus lightcharacteristics of a 515 nm laser device according to an embodiment ofthe present invention. Shown are voltage and light output of HR coated1200 μm long by 1.6 μm wide lasers fabricated on {20-21} with anepitaxial structure oriented in the projection of the c-directionaccording to one or more embodiments. As shown, the lasing spectra ofthe laser device operating with a peak wavelength of +515 nm, which isclearly in the green color regime. In this example, the device includedgallium and nitrogen containing cladding layers that were substantiallyfree from aluminum species.

FIG. 19 is a simplified plot of voltage and light characteristics of acontinuous wave 525 nm laser device according to an embodiment of thepresent invention. As shown is a simplified plot of continuous wave (CW)voltage and current versus light characteristics of a laser devicefabricated on {20-21} operating at a peak wavelength of 525 nm andmaximum output power of over 6.5 mW according to an embodiment of thepresent invention. Shown are voltage and light output of HR coated laserdevice with a cavity that is approximately 600 μm long by approximately1.6 μm oriented in the projection of the c-direction according to one ormore embodiments. In this example, the device included gallium andnitrogen containing cladding layers that were substantially free fromaluminum species.

FIG. 20 is a simplified plot of voltage and light characteristics of acontinuous wave 520 nm laser device operable at 45 mWatts according toan embodiment of the present invention. This diagram is merely anillustration and should not unduly limit the scope of the claims herein.One of ordinary skill in the art would recognize other variations,modifications, and alternatives. As shown is a simplified plot ofcontinuous wave (CW) voltage and current versus light characteristics ofa laser device fabricated on {20-21} operating at a peak wavelength of520 nm and maximum output power of 45 mW and wall-plug efficiency of1.5% according to an embodiment of the present invention. Shown arevoltage and light output of HR coated laser device with a cavity that isapproximately 600 μm long by approximately 1.6 μm oriented in theprojection of the c-direction according to one or more embodiments. Inthis example, the device included gallium and nitrogen containingcladding layers that were substantially free from aluminum species.

As used herein, the term GaN substrate is associated with GroupIII-nitride based materials including GaN, InGaN, AlGaN, or other GroupIII containing alloys or compositions that are used as startingmaterials. Such starting materials include polar GaN substrates (i.e.,substrate where the largest area surface is nominally an (h k l) planewherein h=k=0, and l is non-zero), non-polar GaN substrates (i.e.,substrate material where the largest area surface is oriented at anangle ranging from about 80-100 degrees from the polar orientationdescribed above towards an (h k l) plane wherein l=0, and at least oneof h and k is non-zero) or semi-polar GaN substrates (i.e., substratematerial where the largest area surface is oriented at an angle rangingfrom about +0.1 to 80 degrees or 110-179.9 degrees from the polarorientation described above towards an (h k l) plane wherein l=0, and atleast one of h and k is non-zero).

As shown, the present device can be enclosed in a suitable package. Suchpackage can include TO-38 and TO-56 headers, TO-9, or even non-standardpackaging. In a specific embodiment, the present device can beimplemented in a co-packaging configuration such as described in U.S.Provisional Application No. 61/347,800, commonly assigned, and herebyincorporated by reference for all purposes.

In other embodiments, the present laser device can be configured for avariety of applications. Such applications include laser displays,metrology, communications, health care and surgery, informationtechnology, and others. As an example, the present laser device can beprovided in a laser display such as those described in U.S. Ser. No.12/789,303 filed May 27, 2010, which claims priority to U.S. ProvisionalNos. 61/182,105 filed May 29, 2009 and 61/182,106 filed May 29, 2009,each of which is hereby incorporated by reference herein.

While the above is a full description of the specific embodiments,various modifications, alternative constructions and equivalents may beused. As an example, the packaged device can include any combination ofelements described above, as well as outside of the presentspecification. In other embodiments, the present specification describesone or more specific gallium and nitrogen containing surfaceorientations, but it would be recognized that other plane orientationscan be used. Therefore, the above description and illustrations shouldnot be taken as limiting the scope of the present invention which isdefined by the appended claims.

What is claimed is:
 1. An optical device comprising: a gallium andnitrogen containing substrate member having a {20-21} crystallinesurface region; a laser stripe region formed overlying a portion of the{20-21} crystalline orientation surface region, the laser stripe regionbeing characterized by a cavity orientation substantially parallel to aprojection in the c-direction, the laser strip region having a first endand a second end; a first cleaved facet provided on the first end of thelaser stripe region; and a second cleaved facet provided on the secondend of the laser stripe region.
 2. The device of claim 1 wherein thefirst cleaved facet is substantially parallel with the second cleavedfacet.
 3. The device of claim 1 wherein the first cleaved facetcomprises a first mirror surface.
 4. The device of claim 1 wherein thefirst mirror surface is provided by a scribing and breaking process. 5.The device of claim 4 wherein the scribing is diamond scribed or laserscribed.
 6. The device of claim 4 wherein the scribing is performed witha laser on the top-side using a skip-scribe technique.
 7. The device ofclaim 3 wherein the first mirror surface comprises a reflective coating.8. The device of claim 7 wherein the reflective coating is selected fromsilicon dioxide, hafnia, and titaniatantalum pentoxidezirconia.
 9. Thedevice of claim 3 wherein the first mirror surface comprises ananti-reflective coating.
 10. The device of claim 3 wherein the firstmirror surface comprises a highly-reflective coating.
 11. The device ofclaim 1 wherein the second cleaved facet comprises a second mirrorsurface.
 12. The device of claim 11 wherein the second mirror surface isprovided by a scribing and breaking process.
 13. The device of claim 12wherein the scribing is diamond scribed or laser scribed.
 14. The deviceof claim 12 wherein the scribing is performed with a laser on thetop-side using a skip-scribe process.
 15. The device of claim 11 whereinthe second mirror surface comprises a highly reflective coating.
 16. Thedevice of claim 15 wherein the reflective coating is selected fromsilicon dioxide, hafnia, titania, tantalum pentoxide, or zirconia. 17.The device of claim 11 wherein the second mirror surface comprises ananti-reflective coating.
 18. The device of claim 1 wherein the lengthranges from about 50 microns to about 3000 microns.
 19. The device ofclaim 1 wherein the laser stripe region is substantially free from oneor more aluminum-containing cladding layers.
 20. The device of claim 1further comprising a spontaneously emitted light characterized by awavelength ranging from about 500 to about 580 nanometers.
 21. Thedevice of claim 1 further comprising an n-type metal region overlying abackside of the gallium and nitrogen containing substrate member and anoverlying p-type metal region overlying an upper portion of the laserstripe.
 22. The device of claim 1 wherein the laser stripe comprises anoverlying dielectric layer exposing an upper portion of the laserstripe.
 23. The device of claim 1 further comprising an n-type galliumand nitrogen containing region overlying the surface region, an activeregion overlying the n-type gallium and nitrogen containing region, andthe laser stripe region overlying the active region.
 24. The device ofclaim 23 wherein the active region comprises one to twenty quantum wellregions.
 25. The device of claim 23 wherein the active region comprises3 to 7 quantum well regions.
 26. The device of claim 23 wherein theactive region comprises 4 to 5 quantum well regions.
 27. The device ofclaim 23 wherein the active region comprising an electron blockingregion.
 28. The device of claim 23 wherein the active region ischaracterized by a separate confinement heterostructure between thequantum wells and the n-cladding region.
 29. The device of claim 23wherein the active region is characterized by a separate confinementheterostructure between the quantum wells and the p-cladding region. 30.A method for forming an optical device comprising: providing a galliumand nitrogen containing substrate member having a {20-21} crystallinesurface region; forming a laser stripe region overlying a portion of the{20-21} crystalline orientation surface region, the laser stripe regionbeing characterized by a cavity orientation substantially parallel to aprojection in a c-direction, the laser strip region having a first endand a second end; and forming a pair of facets comprising a firstcleaved facet provided on the first end of the laser stripe region and asecond cleaved facet provided on the second end of the laser striperegion.
 31. The method of claim 30 wherein the {20-21} crystallinesurface region is off-cut less than +/−0.5 deg towards a c-plane and/oran a-plane.
 32. The method of claim 30 wherein the {20-21} crystallinesurface region is off-cut less than less than +/−1 deg towards a c-planeand/or an a-plane.
 33. The method of claim 30 wherein {20-21}crystalline surface region is off-cut less than less than +/−3 degtowards a c-plane and/or an a-plane.
 34. The method of claim 30 whereinthe {20-21} crystalline surface region is off-cut less than less than+/−5 deg towards a c-plane and/or an a-plane.
 35. The method of claim 30wherein {20-21} crystalline surface region is off-cut less than lessthan +/−8 deg towards a c-plane and/or an a-plane.
 36. An optical devicecomprising: a gallium and nitrogen containing substrate member having a{30-31} crystalline surface region; a laser stripe region formedoverlying a portion of the {30-31} crystalline orientation surfaceregion, the laser stripe region being characterized by a cavityorientation substantially parallel to a projection in the c-direction,the laser strip region having a first end and a second end; a firstcleaved facet provided on the first end of the laser stripe region; anda second cleaved facet provided on the second end of the laser striperegion.
 37. The device of claim 36 wherein the first cleaved facet issubstantially parallel with the second cleaved facet.
 38. The device ofclaim 36 wherein the first cleaved facet comprises a first mirrorsurface.
 39. The device of claim 36 wherein the first mirror surface isprovided by a scribing and breaking process.
 40. The device of claim 39wherein the scribing is diamond scribed or laser scribed.
 41. The deviceof claim 39 wherein the scribing is performed with a laser on thetop-side using a skip-scribe technique.
 42. The device of claim 36wherein the first mirror surface comprises a reflective coating.
 43. Thedevice of claim 42 wherein the reflective coating is selected fromsilicon dioxide, hafnia, and titaniatantalum pentoxidezirconia.
 44. Thedevice of claim 36 wherein the first mirror surface comprises ananti-reflective coating.
 45. The device of claim 35 wherein the firstmirror surface comprises a highly-reflective coating.
 46. The device ofclaim 36 wherein the second cleaved facet comprises a second mirrorsurface.
 47. The device of claim 46 wherein the second mirror surface isprovided by a scribing and breaking process.
 48. The device of claim 47wherein the scribing is diamond scribed or laser scribed.
 49. The deviceof claim 47 wherein the scribing is performed with a laser on thetop-side using a skip-scribe technique.
 50. The device of claim 46wherein the second mirror surface comprises a highly reflective coating.51. The device of claim 50 wherein the reflective coating is selectedfrom silicon dioxide, hafnia, titania, tantalum pentoxide, or zirconia.52. The device of claim 46 wherein the second mirror surface comprisesan anti-reflective coating.
 53. The device of claim 36 wherein thelength ranges from about 50 microns to about 3000 microns.
 54. Thedevice of claim 36 wherein the laser stripe region is substantially freefrom substantially all aluminum-containing cladding layers.
 55. Thedevice of claim 36 further comprising a spontaneously emitted lightcharacterized by a wavelength ranging from about 500 to about 580nanometers.
 56. The device of claim 36 wherein the laser stripe isprovided by an etching process selected from dry etching or wet etching.57. The device of claim 36 further comprising an n-type metal regionoverlying a backside of the gallium and nitrogen containing substratemember and an overlying p-type metal region overlying an upper portionof the laser stripe.
 58. The device of claim 36 wherein the laser stripecomprises an overlying dielectric layer exposing an upper portion of thelaser stripe.
 59. The device of claim 36 further comprising an n-typegallium and nitrogen containing region overlying the surface region, anactive region overlying the n-type gallium and nitrogen containingregion, and the laser stripe region overlying the active region.
 60. Thedevice of claim 59 wherein the active region comprises one to twentyquantum well regions.
 61. The device of claim 59 wherein the activeregion comprises 4 to 5 quantum well regions.
 62. The device of claim 59wherein the active region comprises 3 to 7 quantum well regions.
 63. Thedevice of claim 59 wherein the active region comprising an electronblocking region.
 64. The device of claim 59 wherein the active region ischaracterized by a separate confinement heterostructure.
 65. A methodfor forming an optical device comprising: providing a gallium andnitrogen containing substrate member having a {30-31} crystallinesurface region; forming a laser stripe region overlying a portion of the{30-31} crystalline orientation surface region, the laser stripe regionbeing characterized by a cavity orientation substantially parallel to aprojection in a c-direction, the laser strip region having a first endand a second end; and forming a pair of facets comprising a firstcleaved facet provided on the first end of the laser stripe region and asecond cleaved facet provided on the second end of the laser striperegion.
 66. The method of claim 65 wherein the {30-31} crystallinesurface region is off-cut less than +/−0.5 deg towards a c-plane and/oran a-plane.
 67. The method of claim 65 wherein the {30-31} crystallinesurface region is off-cut less than less than +/−1 deg towards a c-planeand/or an a-plane.
 68. The method of claim 65 wherein {30-31}crystalline surface region is off-cut less than less than +/−3 degtowards a c-plane and/or an a-plane.
 69. The method of claim 65 whereinthe {30-31} crystalline surface region is off-cut less than less than+/−5 deg towards a c-plane and/or an a-plane.
 70. The method of claim 65wherein {30-31} crystalline surface region is off-cut less than lessthan +/−8 deg towards a c-plane and/or an a-plane.
 71. An optical devicecomprising: a gallium and nitrogen containing substrate member having a{20-21} crystalline surface region; an n-type gallium and nitrogencontaining cladding material, the n-type gallium and nitrogen containingcladding material being substantially free from an aluminum species; anactive region including multiple quantum well structures overlying then-type gallium and nitrogen containing cladding material; a p-typegallium and nitrogen containing cladding material overlying the activeregion, the p-type gallium and nitrogen containing cladding materialbeing substantially free from an aluminum species; and a laser striperegion configured from at least the active region characterized by acavity orientation substantially parallel to a projection in ac-direction.
 72. The device of claim 71 further comprising a gallium andnitrogen containing electron blocking region overlying the multiplequantum well structures, the gallium and nitrogen containing electronblocking region being substantially free from an aluminum species. 73.The device of claim 71 wherein the multiple quantum well structurescomprises at least one or more InGaN barrier regions; wherein thesubstantially free from aluminum species contain about 2 percentaluminum species and less; and wherein the surface region is off-cut.